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Overview of the main types of Scannig Probe Microscope types:

Scanning tunneling microscope (STM) - using the tunneling current I between the outermost atom of a conducting probe within an atomic distance from a substrate to map out the sample topography and electrical properties.

Atomic force microscope (AFM) - using the van der Waals forces or contact forces between a tip and the sample to measure the sample topography or mechanical properties.

Scanning near-field optical microscope (SNOM) - using the scattered light through a sub-wavelenght aperture to form an image.

• Illustration by Kristian Molhave
• Please acknowledge the Opensource Handbook of Nanoscience and Nanotechnology if you use illustrations from it.

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